RIE: Difference between revisions

From brarlab
Jump to navigation Jump to search
(Created page with "{| class="wikitable" |+ Caption text |- ! User !! Date !! Recipe !! Material !! Thickness !! Time !! Etch Rate |- | Ex || 04/02/19 || NbEtch || Nb || 40nm || 30 secs || 80 nm/...")
 
No edit summary
 
(3 intermediate revisions by 2 users not shown)
Line 1: Line 1:
{| class="wikitable"
{| class="wikitable"
|+Unaxis 790 RIE
|+ Caption text
|-
|-
! User !! Date !! Recipe !! Material !! Thickness !! Time !! Etch Rate
! User !! Date !! Recipe !! Material !! Thickness !! Time !! Etch Rate
!Comments
|-
|-
| Ex || 04/02/19 || NbEtch || Nb || 40nm || 30 secs || 80 nm/m
| Ex || 04/02/19 || NbEtch || Nb || 40nm || 30 s || 80 nm/m
|
|-
|MF
|10/27/21
|NbEtch
|Nb on junctions
|90
|195 s
|
|
|-
|JS
|11/10/21
|50_10_10
|PMMA/Neutral Layer/Graphene/SiO2/Si
|
|10
|N/A Descum
|
|-
|MF
|11/22/21
|NbEtch
|Nb wire
|
|100 minutes
|
|4 wires in Mo holder
|-
|MF
|12/1/21
|50CHF3
|SiO2
|<200nm
|11.75 minutes
|
|Test sample for PECVD dep rate
|-
|-
|}
|}

Latest revision as of 21:16, 1 December 2021

Unaxis 790 RIE
User Date Recipe Material Thickness Time Etch Rate Comments
Ex 04/02/19 NbEtch Nb 40nm 30 s 80 nm/m
MF 10/27/21 NbEtch Nb on junctions 90 195 s
JS 11/10/21 50_10_10 PMMA/Neutral Layer/Graphene/SiO2/Si 10 N/A Descum
MF 11/22/21 NbEtch Nb wire 100 minutes 4 wires in Mo holder
MF 12/1/21 50CHF3 SiO2 <200nm 11.75 minutes Test sample for PECVD dep rate