PECVD: Difference between revisions

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91 bytes added ,  6 December 2021
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|.57 nm/s
|20211122 test sample to determine dep rate
|-
|MF
|12/6/21
|SiOxide2
|SiO2
|350 seconds
|200nm
|
|
|20210922A sample for Nb junctions
|-
|}
25

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